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Equipment Detail

Name

JIB-4500 Multi Beam FIB with EDS and Omniprobe in-situ TEM sample extraction

Manufacturer

JEOL

Make or Model

JIB-4500 Multi Beam FIB

Description

MultiBeam, a new high performance SEM and micro milling FIB, combines the most popular LaB6 electron column in the world with real time milling and monitoring capability. The JIB-4500 MultiBeam delivers high throughput and increased productivity with simultaneous viewing, analysis, and micro milling functions for a variety of applications.

External Link

Picture

Contact Information

Contact Name

Neal Ricks

Telephone Number

305-348-1651

Fax

305-348-2649

Email

Neal.Ricks@fiu.edu
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