Skip Ribbon Commands
Skip to main content

Equipment Detail

Name

JEOL 7000 Scanning Electron Microscope

Manufacturer

JEOL

Make or Model

7000

Description

Electron microscope equipped with Deben beam blanker and Nabity e-Beam Lithography system for nanoscale direct-write patterning.  Capable of defining features as small as 20nm.

External Link

Picture

Contact Information

Contact Name

Neal Ricks

Telephone Number

305-348-1651

Fax

305-348-2649

Email

Neal.Ricks@fiu.edu
lssf footer