Skip Ribbon Commands
Skip to main content

Equipment Detail

Name

JEOL 6330F Field Emission Scanning Electron Microscopy (FEG-SEM) with Energy Dispersive Spectroscopy (EDS)

Manufacturer

JOEL

Make or Model

6330F

Description

‚ÄčUltra high vacuum scanning electron microscope with cold field emission electron source enabling very high resolution imaging with increased brightness. Fully operational at accelerating voltages from 0.5-30 kV, up to magnifications of 500k, with a theoretical resolution of 2 nm.

External Link

Picture

Contact Information

Contact Name

Neal Ricks

Telephone Number

305-348-1651

Fax

305-348-2649

Email

Neal.Ricks@fiu.edu
lssf footer