Our SEM-EDS is coupled to an x-ray beam having dual capability to conduct high magnification imaging as well as elemental analysis by either SEM-EDS or u-XRF. This analytical tool provides exceptional depth of field, minimal specimen preparation, and the ability to combine the technique with X-ray microanalysis. Designed to image samples ranging from biological specimens to forensic trace evidence and nanomaterials, the XL provides high-resolution imaging and image enhancement capabilities.
Our SEM system has different detectors: backscatter detector, secondary electron detector, CCD camera and EDX detector. The instrument also has the dual capabilities of working in high and low vacuum modes. Low vacuum mode eliminated the need to coat non-conductive samples and image wet samples.
Typical detection limits for SEM-EDS are >0.1% while u-XRF detection limits range between 10-100ppm.